Front End Equipment
|
Back End Equipment
|
Spare Parts
All Equipment
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Ovens
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Dicing Saw
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Bonders
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Marking
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Probers
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Handlers
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ATE
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SMT Equipment
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Others
TISI ID
Manufacturer
Model
Wafer Size
TISI ID
Manufacturer
Model
Description
Wafer Size
Vintage
Q.ty
Sales
cond.
Lead Time
20171211-96
Famecs
FNBS-600AD 10E-P
NG Buffer
-
2013
As-is Were-is
Immediately
20171211-41
Volttech
Ati
LCR Meter[ATi]
-
-
As-is Were-is
Immediately
20171211-40
Teradyne
UltraFLEX
TESTER
-
2005
As-is Were-is
Immediately
20171211-39
Teradyne
UltraFLEX
ATE TEST
-
2011
As-is Were-is
Immediately
20171211-38
Oryx instrument
Orion
CDM ESD Tester
-
2002
As-is Were-is
Immediately
20171211-37
Oryx instrument
CELESTRON
TLP Tester
8
2009
As-is Were-is
Immediately
20171211-36
Oryx instrument
11000EX
ESD Tester[Latch up Test System
-
2003
As-is Were-is
Immediately
20171211-35
Mosaid
MS4205
-
12
-
As-is Were-is
Immediately
20171211-34
LTX CREDENCE
IMS Electra
Mixed Signal Tester System
8
-
As-is Were-is
Immediately
20171211-33
LEO
LTA-700
Lifetime Tester
8
1997
As-is Were-is
Immediately
20171211-32
Keithely
SYSTEM 83[2430]
C-V Characterization System
-
2006
As-is Were-is
Immediately
20171211-31
Keithely
228A
Voltage/current
-
-
As-is Were-is
Immediately
20171211-30
Electroglas
EG2001X
Wafer Prober
6
-
As-is Were-is
Immediately
20171211-29
Electroglas
EG2001X
Wafer Prober
6
-
As-is Were-is
Immediately
20171211-28
Electroglas
EG2001X
Wafer Prober
6
-
As-is Were-is
Immediately
21071211-27
Electroglas
EG2001X
Wafer Prober
6
-
As-is Were-is
Immediately
20171211-26
Electroglas
EG2001CX
Wafer Prober
6
-
As-is Were-is
Immediately
20171211-25
Electroglas
EG2001
Wafer Prober
6
-
As-is Were-is
Immediately
20171211-24
Digital Instruments
D5000
Scanning Probe Microscope Sys
-
-
As-is Were-is
Immediately
20171211-23
Cascade Microtech
REL6100
Probe Station[REL-6100]
-
2008
As-is Were-is
Immediately
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