Front End Equipment  |  Back End Equipment  |  Spare Parts   All Equipment   -   Ovens   -   Dicing Saw   -   Bonders   -   Marking   -   Probers   -   Handlers   -   ATE   -   SMT Equipment   -   Others TISI ID Manufacturer Model Wafer Size TISI ID Manufacturer Model Description Wafer Size Vintage Q.ty Sales cond. Lead Time 20171211-96 Famecs FNBS-600AD 10E-P NG Buffer - 2013 As-is Were-is Immediately 20171211-41 Volttech Ati LCR Meter[ATi] - - As-is Were-is Immediately 20171211-40 Teradyne UltraFLEX TESTER - 2005 As-is Were-is Immediately 20171211-39 Teradyne UltraFLEX ATE TEST - 2011 As-is Were-is Immediately 20171211-38 Oryx instrument Orion CDM ESD Tester - 2002 As-is Were-is Immediately 20171211-37 Oryx instrument CELESTRON TLP Tester 8 2009 As-is Were-is Immediately 20171211-36 Oryx instrument 11000EX ESD Tester[Latch up Test System - 2003 As-is Were-is Immediately 20171211-35 Mosaid MS4205 - 12 - As-is Were-is Immediately 20171211-34 LTX CREDENCE IMS Electra Mixed Signal Tester System 8 - As-is Were-is Immediately 20171211-33 LEO LTA-700 Lifetime Tester 8 1997 As-is Were-is Immediately 20171211-32 Keithely SYSTEM 83[2430] C-V Characterization System - 2006 As-is Were-is Immediately 20171211-31 Keithely 228A Voltage/current - - As-is Were-is Immediately 20171211-30 Electroglas EG2001X Wafer Prober 6 - As-is Were-is Immediately 20171211-29 Electroglas EG2001X Wafer Prober 6 - As-is Were-is Immediately 20171211-28 Electroglas EG2001X Wafer Prober 6 - As-is Were-is Immediately 21071211-27 Electroglas EG2001X Wafer Prober 6 - As-is Were-is Immediately 20171211-26 Electroglas EG2001CX Wafer Prober 6 - As-is Were-is Immediately 20171211-25 Electroglas EG2001 Wafer Prober 6 - As-is Were-is Immediately 20171211-24 Digital Instruments D5000 Scanning Probe Microscope Sys - - As-is Were-is Immediately 20171211-23 Cascade Microtech REL6100 Probe Station[REL-6100] - 2008 As-is Were-is Immediately     1 / 2 / 3 /