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TISI ID Manufacturer Model Description Wafer Size Vintage Q.ty Sales
cond.		 Lead Time
11230 KLA Tencor 2132 / 2131 Defect Review / Wafer Inspection 2 as-is Immediately
11229 Jeol / Holon EMU-220 CD SEM / Mask Measurement 1 as-is Immediately
11228 JEOL JWS-7505 Wafer Inspection System 1 as-is Immediately
11207 Censor ANS 100 Unpatterned Wafer Dark Field Inspection System 1 as-is Immediately
11206 Brooks Automation / Zygo ZARIS Reticle Macro Inspection Tool, with Staubli Robot 1 as-is Immediately
11196 AMAT OPAL 7830i CD SEM, Automated 1 as-is Immediately
11191 AMAT Compass 300 Patterned Wafer Inspection System 1 as-is i
11190 AMAT SemVision CX Plus DR SEM 2 as-is i
11112 Hitachi S-9220S CD SEM 200mm 2000 1 as-is Immediately
11111 Hitachi S-9220 CD SEM 200mm 2000 2 as-is Immediately
11110 Hitachi S-8840 CD SEM 200mm 1997 2 as-is Immediately
11109 Hitachi S-8820S CD SEM 200mm 1996 1 as-is Immediately
11087 KLA Tencor KLA5200XL Overlay, Ver 14.40.15 1 as-is Immediately
11079 KLA Tencor KT2401 ILM2401 Automated Macro Defect Inspection System 1 as-is Immediately
11067 KLA Tencor Profiler HRP 220 STEP-HEIGHT PROFILER HRP-220 1 as-is Immediately
11059 KLA Tencor UV-1050 Fully automated measurement module, automated wafer handling / Windows NT user interface / 2 cassette loader for 1 specific wafer size 2 as-is Immediately
11058 AMAT DR SEMVision Cx SEMIVISION cX Defect review Sys including Color MPSI for Enchanced Topography & Material Information 4 as-is Immediately
11054 KLA Tencor KLA Surfscan SP1 TB1 Bare Wafer Inspection 1 as-is Immediately
11052 AMAT COMPASS PRO 200 Defect Inspection 4 as-is Immediately
 
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